Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities.
نویسندگان
چکیده
Small polaron carrier density in epitaxial, doped CeO(2) thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.
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ورودعنوان ژورنال:
- Physical chemistry chemical physics : PCCP
دوره 11 37 شماره
صفحات -
تاریخ انتشار 2009